Invention Grant
- Patent Title: Terahertz wave measuring device, measuring method, and measuring rig
-
Application No.: US14965972Application Date: 2015-12-11
-
Publication No.: US09784610B2Publication Date: 2017-10-10
- Inventor: Hirohisa Uchida
- Applicant: ARKRAY, Inc.
- Applicant Address: JP Kyoto
- Assignee: ARKRAY, Inc.
- Current Assignee: ARKRAY, Inc.
- Current Assignee Address: JP Kyoto
- Agency: Morgan, Lewis & Bockius LLP
- Priority: JP2014-254392 20141216
- Main IPC: G01J1/08
- IPC: G01J1/08 ; G01J1/42 ; G01J1/02 ; G01N21/03 ; G01N21/35 ; G01N21/3577 ; G01N21/3581 ; G01N21/05

Abstract:
There is provided a terahertz wave measuring device including (1) a terahertz wave generation element that generates a terahertz wave by difference frequency generation based on excitation light that is incident to the terahertz wave generation element, the excitation light including a plurality of different wavelength components and being condensed so as to have a beam diameter of a predetermined size, (2) a structural body through which the terahertz wave is transmitted; and (3) a detector that detects an intensity of the terahertz wave that has been transmitted through the structural body, wherein the structural body includes a sample holder of a predetermined width that holds a sample, and the structural body is in close contact with or is joined to the terahertz wave generation element.
Public/Granted literature
- US20160169735A1 Terahertz Wave Measuring Device, Measuring Method, and Measuring Rig Public/Granted day:2016-06-16
Information query