Invention Grant
- Patent Title: X-ray analyzer
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Application No.: US14611668Application Date: 2015-02-02
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Publication No.: US09784700B2Publication Date: 2017-10-10
- Inventor: Masahiro Sakuta
- Applicant: Hitachi High-Tech Science Corporation
- Applicant Address: JP Minato-ku, Tokyo
- Assignee: Hitachi High-Tech Science Corporation
- Current Assignee: Hitachi High-Tech Science Corporation
- Current Assignee Address: JP Minato-ku, Tokyo
- Agency: Banner & Witcoff, Ltd.
- Priority: JP2014-058388 20140320
- Main IPC: G01N23/22
- IPC: G01N23/22 ; G06F1/16 ; G06F3/033 ; G06F3/048 ; G01N23/223 ; G06F3/0354 ; G06F3/01 ; G06F3/041 ; G06F3/0484

Abstract:
A fluorescent X-ray analyzer includes a sample stage, an X-ray source that irradiates a sample with primary X-rays, a detector that detects secondary X-rays generated from the sample, a position adjustment mechanism that adjusts relative positions of the sample stage and the primary X-rays, an observation mechanism that obtains an observation image of the sample, and a computer having a display unit and an input unit. The computer has a function of, in response to a pointer being moved from a central region of the observation screen to a certain position by dragging the input unit while maintaining a state in which an input element of the input unit is held, moving the sample stage in a movement direction and at a movement speed corresponding to a direction and a distance of the certain position relative to the central region.
Public/Granted literature
- US20150268179A1 X-Ray Analyzer Public/Granted day:2015-09-24
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