Invention Grant
- Patent Title: Eddy current inspection probe based on magnetoresistive sensors
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Application No.: US14255272Application Date: 2014-04-17
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Publication No.: US09784715B2Publication Date: 2017-10-10
- Inventor: Jevne Branden Micheau-Cunningham , Jeffrey Raymond Gueble , William Frederick Ziegenhagen , Stephen Timm , Paubla Mejia Tarango
- Applicant: Zetec, Inc.
- Applicant Address: US WA Snoqualmie
- Assignee: ZETEC, INC.
- Current Assignee: ZETEC, INC.
- Current Assignee Address: US WA Snoqualmie
- Agency: Snyder, Clark, Lesch & Chung, LLP
- Main IPC: G01N27/82
- IPC: G01N27/82 ; G01N27/90 ; G01R33/09

Abstract:
A device and method of eddy current based nondestructive testing of tubular structures made of electrically conductive materials is disclosed. The device includes a plurality of excitation electromagnets having an axis of symmetry and magnetoresistive sensors having an easy axis for magnetic field sensing; wherein the magnetoresistive sensors are arranged in a circular array on a single plane with the easy axis aligned radially with respect to the circular pattern and wherein the electromagnets are arranged in a circular pattern on both sides of the plane with their axes of symmetry being arranged parallel to the plane and orthogonal to radii of the circular pattern on which the electromagnets are placed.
Public/Granted literature
- US20140312891A1 Eddy Current Inspection Probe Based on Magnetoresistive Sensors Public/Granted day:2014-10-23
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