Invention Grant
- Patent Title: Algorithm for measuring wear pin length using an input image
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Application No.: US14609368Application Date: 2015-01-29
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Publication No.: US09786042B2Publication Date: 2017-10-10
- Inventor: Sharath Venkatesha , Ryan Andrew Lloyd , Dinkar Mylaraswamy , Mark E. Behnke
- Applicant: Honeywell International Inc.
- Applicant Address: US NJ Morris Plains
- Assignee: Honeywell International Inc.
- Current Assignee: Honeywell International Inc.
- Current Assignee Address: US NJ Morris Plains
- Agency: Shumaker & Sieffert, P.A.
- Main IPC: G06T7/00
- IPC: G06T7/00 ; B60T17/22 ; F16D66/02 ; G01B5/00 ; G01B11/02 ; G01B11/00 ; G01B11/14 ; G06K9/46

Abstract:
In one example, the disclosure is directed to a method of determining a length of a wear pin in a brake assembly. The method includes obtaining an input image of a portion of the brake assembly, such as with a camera. The input image includes the wear pin and a reference object, and the reference object has a known dimension. A processor may determine, based on the input image, an image dimension of the reference object. The processor may determine, based on the input image, an image dimension of the wear pin. The processor may further determine, based on the image dimension of the reference object, the image dimension of the wear pin, and the known dimension of the reference object, an estimated measurement of the dimension of the wear pin.
Public/Granted literature
- US20160225130A1 ALGORITHM FOR MEASURING WEAR PIN LENGTH USING AN INPUT IMAGE Public/Granted day:2016-08-04
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