Invention Grant
- Patent Title: Failure prognosis device, method, and storage system
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Application No.: US15230796Application Date: 2016-08-08
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Publication No.: US09786306B2Publication Date: 2017-10-10
- Inventor: Takashi Usui , Toshiaki Ohgushi , Takeichiro Nishikawa
- Applicant: KABUSHIKI KAISHA TOSHIBA
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.
- Priority: JP2015-158863 20150811
- Main IPC: G11B20/00
- IPC: G11B20/00 ; G11B27/36 ; G11B5/40 ; G11B19/04

Abstract:
According to one embodiment, a failure prognosis device includes circuitry configured to determine whether a sign of failure exists in a head, based on a signal quality value and a floating quantity of the head, the signal quality value being based on an error between a reproducing signal acquired from the head when reading data stored on a storage surface of a disk and a predetermined target signal, and output a determination result.
Public/Granted literature
- US20170047086A1 FAILURE PROGNOSIS DEVICE, METHOD, AND STORAGE SYSTEM Public/Granted day:2017-02-16
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