Invention Grant
- Patent Title: Compensation for threshold voltage variation of memory cell components
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Application No.: US15267807Application Date: 2016-09-16
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Publication No.: US09786345B1Publication Date: 2017-10-10
- Inventor: Aswin Thiruvengadam , Hernan A. Castro
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee Address: US ID Boise
- Agency: Holland & Hart LLP
- Main IPC: G11C11/16
- IPC: G11C11/16 ; G11C11/22

Abstract:
Methods, systems, and devices for operating a ferroelectric memory cell or cells are described. Before reading a memory cell, the voltage on an access line of the memory cell may be initialized to a value associated with the threshold voltage of a switching component in electronic communication with the memory cell. The voltage may be initialized by reducing the existing voltage on the access line to the value. The switching component or an additional pull down device, or both, may be used to reduce the voltage of the access line. After the access line has been initialized to the value, the read operation may be triggered.
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