Invention Grant
- Patent Title: Channel silicon germanium formation method
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Application No.: US15134898Application Date: 2016-04-21
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Publication No.: US09786547B2Publication Date: 2017-10-10
- Inventor: Kangguo Cheng , Nicolas Degors , Shawn P. Fetterolf , Ahmet S. Ozcan
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee Address: US NY Armonk
- Agency: Cantor Colburn LLP
- Agent Steven Meyers
- Main IPC: H01L21/762
- IPC: H01L21/762 ; H01L21/321 ; H01L21/3205 ; H01L21/3115

Abstract:
A method of making a channel region in a semiconductor device includes providing a substrate having a first transistor area arranged adjacent to a second transistor area; growing an epitaxial layer on the second transistor area of the substrate; forming a trench in the substrate between the first transistor area and the second transistor area; performing a condensation technique to thermally mix materials of the epitaxial layer and the substrate; and filling the trench with a dielectric material to form a shallow trench isolation region between a first channel region of the first transistor and a second channel region of the second transistor; wherein performing the condensation technique is performed after forming the trench.
Public/Granted literature
- US20170170055A1 NOVEL CHANNEL SILICON GERMANIUM FORMATION METHOD Public/Granted day:2017-06-15
Information query
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