Invention Grant
- Patent Title: System for applying phantom sample to evaluate optical analysis device, storage device storing instructions, method and phantom sample
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Application No.: US14738134Application Date: 2015-06-12
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Publication No.: US09797839B2Publication Date: 2017-10-24
- Inventor: Mitsushiro Yamaguchi
- Applicant: OLYMPUS CORPORATION
- Applicant Address: JP Tokyo
- Assignee: OLYMPUS CORPORATION
- Current Assignee: OLYMPUS CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Scully, Scott, Murphy & Presser, P.C.
- Priority: JP2013-050775 20130313
- Main IPC: G01D18/00
- IPC: G01D18/00 ; G01N21/64 ; G01M11/00 ; G01N21/27 ; G02B21/00 ; G02B21/34 ; G01M11/02

Abstract:
An optical system of an optical analysis device is easily evaluated with high accuracy.There is provided a method of evaluating an optical analysis device including an optical system A capable of forming a confocal volume C at a focal position by condensing excitation light B, the method including the steps of: placing, at the focal position of the optical system A, a phantom sample in which two or more types of solid members having different fluorescent substance concentrations are arranged adjacent to each other; irradiating the phantom sample 1 with excitation light through the optical system A while relatively moving the confocal volume C formed by the optical system A and the phantom sample in an arrangement direction of the solid members; detecting fluorescent light generated in the solid members placed in the confocal volume C; and evaluating the optical system A based on the detected fluorescent light.
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