Invention Grant
- Patent Title: System and method for measuring permittivity
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Application No.: US14664228Application Date: 2015-03-20
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Publication No.: US09810645B2Publication Date: 2017-11-07
- Inventor: Tsun-Hsu Chang , Hsein-Wen Chao , Wei-Syuan Wong
- Applicant: National Tsing Hua University
- Applicant Address: TW Hsinchu
- Assignee: NATIONAL TSING HUA UNIVERSITY
- Current Assignee: NATIONAL TSING HUA UNIVERSITY
- Current Assignee Address: TW Hsinchu
- Agency: Muncy, Geissler, Olds & Lowe, P.C.
- Priority: TW103141048A 20141126
- Main IPC: G01R27/04
- IPC: G01R27/04 ; G01N22/00 ; G01N27/04

Abstract:
A system for measuring a permittivity includes a resonant chamber, a conductive probe, a platform, a pillar, a detector, and a computing module. The resonant chamber has a cavity. The conductive probe is configured for introducing a microwave into the cavity of the resonant chamber. The platform is configured for carrying a sample. The pillar is positioned between the platform and a chamber wall, so that the platform protrudes from the chamber wall. The detector is used to detect a resonant frequency of the microwave when resonance occurs within the cavity. The computing module is configured for calculating a permittivity corresponding to the measured resonant frequency according to a corresponding relationship between resonant frequency and permittivity. The above-mentioned system for measuring a permittivity is capable of measuring a broader range of permittivity with simplified measurement steps and higher accuracy. A method for measuring a permittivity is also disclosed.
Public/Granted literature
- US20160146742A1 SYSTEM AND METHOD FOR MEASURING PERMITTIVITY Public/Granted day:2016-05-26
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