Invention Grant
- Patent Title: System and apparatus for trusted and secure test ports of integrated circuit devices
-
Application No.: US14972990Application Date: 2015-12-17
-
Publication No.: US09810736B2Publication Date: 2017-11-07
- Inventor: Rodrick Cottrell , Dee C. Neuenschwander
- Applicant: Raytheon Company
- Applicant Address: US MA Waltham
- Assignee: Raytheon Company
- Current Assignee: Raytheon Company
- Current Assignee Address: US MA Waltham
- Agency: Burns & Levinson LLP
- Agent Joseph M. Maraia
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G01R31/317 ; G01R31/3177

Abstract:
A trusted boot device secures JTAG scan chains of integrated circuit components on a circuit card assembly without necessarily modifying the integrated circuit components. Component JTAG port I/O scan chain signal pins are independently routed to FPGA fabric on the trusted boot device. The trusted boot device monitors the JTAG paths and triggers a security event if unauthorized activity is detected on a JTAG path. JTAG paths on the secure trusted boot device are latch disabled by default and upon detection of a security event. JTAG paths are only enabled for a predefined length of time. To prevent JTAG access when protected data is exposed, a watchdog timer latch disables the JTAG paths when the predefined time has expired and may trigger a security event if activity is detected after the time has expired. A power cycle is then used to re-enable authenticated JTAG enable requests.
Public/Granted literature
- US20170176530A1 SYSTEM AND APPARATUS FOR TRUSTED AND SECURE TEST PORTS OF INTEGRATED CIRCUIT DEVICES Public/Granted day:2017-06-22
Information query