Invention Grant
- Patent Title: Method, image processing system and computer-readable recording medium for item defect inspection
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Application No.: US15099609Application Date: 2016-04-15
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Publication No.: US09811899B2Publication Date: 2017-11-07
- Inventor: Hao-Yu Chien , Chan-Hao Hsu , Tzung-Hua Ying
- Applicant: Powerchip Technology Corporation
- Applicant Address: TW Hsinchu
- Assignee: Powerchip Technology Corporation
- Current Assignee: Powerchip Technology Corporation
- Current Assignee Address: TW Hsinchu
- Agency: JCIPRNET
- Priority: TW104143977A 20151228
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06T5/00 ; G06T5/50

Abstract:
A method, image processing system, and computer-readable recording medium for item defect inspection are provided. The method is as follows. A test image and a reference image of a test item are received. A test block and a corresponding reference block are obtained from the test image and the reference image to generate a test block image and a reference block image. The test block image and the reference block image are respectively partitioned into multiple sub-blocks. All interfering sub-blocks are identified and filtered out from the test block image and the reference block image, and a shift calibration parameter is obtained accordingly. The test block in the test image is calibrated based on the shift calibration parameter to generate a calibrated test block image. The calibrated test block image and the reference block image are compared to obtain defect information of the test item corresponding to the test block.
Public/Granted literature
- US20170186144A1 METHOD, IMAGE PROCESSING SYSTEM AND COMPUTER-READABLE RECORDING MEDIUM FOR ITEM DEFECT INSPECTION Public/Granted day:2017-06-29
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