Invention Grant
- Patent Title: Memory circuit with transistors having different threshold voltages and method of operating the memory circuit
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Application No.: US14601652Application Date: 2015-01-21
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Publication No.: US09812181B2Publication Date: 2017-11-07
- Inventor: Chou-Ying Yang , Yi-Cheng Huang , Shang-Hsuan Liu
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee Address: TW Hsinchu
- Agency: Hauptman Ham, LLP
- Main IPC: G11C7/00
- IPC: G11C7/00 ; G11C7/12 ; G11C7/06 ; G11C7/10 ; G11C7/22

Abstract:
A memory circuit includes a memory cell, a data line configured to be coupled with the memory cell, a node, a precharge circuit, a first transistor of a first type, and a second transistor of the first type. The precharge circuit is configured to charge the node toward a predetermined voltage level. The first transistor of the first type has a drain coupled with the node and a source coupled with the data line, and the first transistor has a first threshold voltage. The second transistor of the first type has a drain coupled with the node and a source coupled with the data line, and the second transistor having a second threshold voltage different from the first threshold voltage.
Public/Granted literature
- US20150138904A1 MEMORY CIRCUIT AND METHOD OF OPERATING THE MEMORY CIRCUIT Public/Granted day:2015-05-21
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