Invention Grant
- Patent Title: X-ray source and X-ray imaging method
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Application No.: US14537910Application Date: 2014-11-11
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Publication No.: US09812281B2Publication Date: 2017-11-07
- Inventor: Hui-Hsin Lu , Wei-Hsin Wang , Jiun-Lin Guo , Shih-Chung Lee
- Applicant: Industrial Technology Research Institute
- Applicant Address: TW Hsinchu
- Assignee: Industrial Technology Research Institute
- Current Assignee: Industrial Technology Research Institute
- Current Assignee Address: TW Hsinchu
- Agency: JCIPRNET
- Priority: TW103118063A 20140523
- Main IPC: H01J35/06
- IPC: H01J35/06 ; H01J35/10 ; H01J35/16 ; H01J35/18 ; H01J35/24 ; G21K1/04

Abstract:
An X-ray imaging method including the following steps is provided. An X-ray source is provided, wherein the X-ray source includes a housing, a cathode, and an anode target. The housing has an end window. The cathode is disposed in the housing, and the anode target is disposed beside the end window. The cathode is caused to provide an electron beam. A portion of the electron beam hits at least a part of areas of the anode target to generate an X-ray and the X-ray is emitted out of the housing through the end window. The X-ray is caused to irradiate an object to generate X-ray image information. An image detector is used to receive the X-ray image information.
Public/Granted literature
- US20150340190A1 X-RAY SOURCE AND X-RAY IMAGING METHOD Public/Granted day:2015-11-26
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