Invention Grant
- Patent Title: Method of manufacturing a semiconductor device
-
Application No.: US14832321Application Date: 2015-08-21
-
Publication No.: US09818735B2Publication Date: 2017-11-14
- Inventor: Cheng-Ying Ho , Wen-De Wang , Jen-Cheng Liu , Dun-Nian Yaung
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Current Assignee Address: TW Hsinchu
- Agency: WPAT, P.C., Intellectual Property Attorneys
- Agent Anthony King
- Main IPC: H01L25/00
- IPC: H01L25/00 ; H01L21/762 ; H01L23/522 ; H01L21/768 ; H01L25/065 ; H01L21/285 ; H01L21/288 ; H01L23/48 ; H01L23/00 ; H01L23/532

Abstract:
A method of manufacturing a semiconductor device includes providing a first semiconductor chip comprising a first metallic structure, a first surface and a second surface opposite to the first surface; providing a second semiconductor chip comprising a second metallic structure; bonding the first semiconductor chip with the second semiconductor chip on the second surface; forming a first recessed portion including a first sidewall and a first bottom surface coplanar with a top surface of the first metallic structure; forming a second recessed portion including a second sidewall and a second bottom surface coplanar with a top surface of the second metallic structure; forming a dielectric layer over the first sidewall and the second sidewall; and forming a conductive material over the dielectric layer, the top surface of the first metallic structure and the top surface of the second metallic structure.
Public/Granted literature
- US20150364458A1 METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE Public/Granted day:2015-12-17
Information query
IPC分类: