Invention Grant
- Patent Title: Method and apparatus for performing ray-node intersection test
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Application No.: US14690708Application Date: 2015-04-20
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Publication No.: US09830733B2Publication Date: 2017-11-28
- Inventor: Seokjoong Hwang , Youngsam Shin , Wonjong Lee , Jaedon Lee
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-Do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si, Gyeonggi-Do
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2014-0124636 20140918
- Main IPC: G06T15/40
- IPC: G06T15/40 ; G06T15/06

Abstract:
A method and apparatus to perform a ray-node intersection test are provided. The method includes receiving an input representing coordinates of a bounding box and an origin coordinate of a ray as fixed-point numbers, obtaining difference values between the input coordinates of the bounding box and the origin coordinate, and obtaining multiplication values between the obtained difference values and a reciprocal number of a direction vector of the ray, where the reciprocal number is a floating-point number.
Public/Granted literature
- US20160085510A1 METHOD AND APPARATUS FOR PERFORMING RAY-NODE INTERSECTION TEST Public/Granted day:2016-03-24
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