Invention Grant
- Patent Title: Pr-containing scintillator single crystal, method of manufacturing the same, radiation detector, and inspection apparatus
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Application No.: US11718776Application Date: 2005-11-07
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Publication No.: US09834858B2Publication Date: 2017-12-05
- Inventor: Akira Yoshikawa , Hiraku Ogino , Kei Kamada , Kenji Aoki , Tsuguo Fukuda
- Applicant: Akira Yoshikawa , Hiraku Ogino , Kei Kamada , Kenji Aoki , Tsuguo Fukuda
- Applicant Address: JP Miyagi JP Tokyo
- Assignee: TOHOKU TECHNO ARCH CO., LTD.,FURUKAWA CO., LTD.
- Current Assignee: TOHOKU TECHNO ARCH CO., LTD.,FURUKAWA CO., LTD.
- Current Assignee Address: JP Miyagi JP Tokyo
- Agency: Rankin, Hill & Clark LLP
- Priority: JP2004-324353 20041108; JP2005-025616 20050201
- International Application: PCT/JP2005/020386 WO 20051107
- International Announcement: WO2006/049284 WO 20060511
- Main IPC: C01F17/00
- IPC: C01F17/00 ; C30B15/00 ; C30B15/08 ; C09K11/77 ; C30B29/22 ; C30B29/28 ; C30B29/34 ; G01T1/164 ; G01T1/29 ; G21K4/00
Abstract:
The present invention provides an oxide-base scintillator single crystal having an extremely large energy of light emission, adoptable to X-ray CT and radioactive ray transmission inspection apparatus, and more specifically to provide a Pr-containing, garnet-type oxide single crystal, a Pr-containing perovskite-type oxide single crystal, and a Pr-containing silicate oxide single crystal allowing detection therefrom light emission supposedly ascribable to 5d-4f transition of Pr.
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