Invention Grant
- Patent Title: Absolute distance measurement apparatus and method using laser interferometric wavelength leverage
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Application No.: US15304062Application Date: 2015-03-27
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Publication No.: US09835441B2Publication Date: 2017-12-05
- Inventor: Benyong Chen , Liping Yan , Shihua Zhang
- Applicant: ZHEJIANG SCI-TECH UNIVERSITY
- Applicant Address: CN Zhejiang
- Assignee: ZHEJIANG SCI-TECH UNIVERSITY
- Current Assignee: ZHEJIANG SCI-TECH UNIVERSITY
- Current Assignee Address: CN Zhejiang
- Agency: JCIPRNET
- International Application: PCT/CN2015/075187 WO 20150327
- International Announcement: WO2016/154780 WO 20161006
- Main IPC: G01B11/14
- IPC: G01B11/14 ; G01B9/02 ; G01B11/00

Abstract:
An absolute distance measurement apparatus and method using laser interferometric wavelength leverage includes a light source system, a wavelength-leverage laser interferometric system and an interference signal processing and controlling system. The light source system outputs a orthogonally linearly polarized beam with the wavelength λ1 and the wavelength λ2. The orthogonally linearly polarized beam projects onto the wavelength-leverage laser interferometric system to form the interference beam. The interference beam projects onto the interference signal processing and controlling system. In the wavelength-leverage laser interferometric system, the synthetic wavelength and the single wavelength as well as the measured absolute distance and the moving displacement of the cube-corner prism in the reference arm form a wavelength-leverage absolute distance measurement relationship.
Public/Granted literature
- US20170038192A1 ABSOLUTE DISTANCE MEASUREMENT APPARATUS AND METHOD USING LASER INTERFEROMETRIC WAVELENGTH LEVERAGE Public/Granted day:2017-02-09
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