Invention Grant
- Patent Title: Airtight test apparatus and airtight test method using the same
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Application No.: US14277043Application Date: 2014-05-13
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Publication No.: US09835517B2Publication Date: 2017-12-05
- Inventor: Yen-Pang Lee
- Applicant: PEGATRON CORPORATION
- Applicant Address: TW Taipei
- Assignee: PEGATRON CORPORATION
- Current Assignee: PEGATRON CORPORATION
- Current Assignee Address: TW Taipei
- Agent Winston Hsu
- Priority: TW102120549A 20130610
- Main IPC: G01M3/34
- IPC: G01M3/34 ; G01M3/32

Abstract:
The present invention discloses an airtight test apparatus and an airtight test method using the same for testing an airtight property of a case assembled with a plurality of additional members thereon in which the case has through holes corresponding to the additional members. The airtight test apparatus comprises a base, a top plate and a plurality of sealing members selectively and detachably disposed on the top plate. The top plate is capable of moving towards the base to allow the sealing members to correspondingly seal the through holes. During test, the case is placed on the base to form a gas chamber, an air-extracting is performed for the gas chamber and an air pressure is detected. When the detected air pressure is larger than a predetermined value, the sealing members can be selectively utilized to seal the corresponding through holes for determining which through holes have poor airtight property.
Public/Granted literature
- US20140360251A1 AIRTIGHT TEST APPARATUS AND AIRTIGHT TEST METHOD USING THE SAME Public/Granted day:2014-12-11
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