Invention Grant
- Patent Title: Gas analysis device
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Application No.: US15366054Application Date: 2016-12-01
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Publication No.: US09835556B2Publication Date: 2017-12-05
- Inventor: Takuya Ido , Yasushi Hirata , Toshiaki Nakagawa
- Applicant: HORIBA, LTD.
- Applicant Address: JP Kyoto
- Assignee: Horiba, Ltd.
- Current Assignee: Horiba, Ltd.
- Current Assignee Address: JP Kyoto
- Agency: Brooks Kushman P.C.
- Priority: JP2014-212310 20141017
- Main IPC: G01J5/02
- IPC: G01J5/02 ; G01N21/55 ; G01N21/61 ; G01N33/00

Abstract:
A gas analysis device includes a probe tube, a flange, an optical system member, and heaters. The probe tube includes an optical path through which measurement light is projected onto a prescribed measurement region of a sample gas flowing through a flue and/or is received from the measurement region. The flange is fixed to the outer periphery of the probe tube and is attached to a pipe side wall. The optical system member projects measurement light onto the sample gas S within the measurement region and/or receives measurement light from the measurement region. The heaters are disposed within the flange and heats the portion where the probe tube and flange are fixed to each other.
Public/Granted literature
- US20170082537A1 GAS ANALYSIS DEVICE Public/Granted day:2017-03-23
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