Invention Grant
- Patent Title: Evaluation system and a method for evaluating a substrate
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Application No.: US14946693Application Date: 2015-11-19
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Publication No.: US09835563B2Publication Date: 2017-12-05
- Inventor: Yoram Uziel , Ron Naftali , Ofer Adan , Haim Feldman , Ofer Shneyour , Ron Bar-Or , Doron Korngut
- Applicant: APPLIED MATERIALS ISRAEL LTD.
- Applicant Address: IL Rehovot
- Assignee: APPLIED MATERIALS ISRAEL LTD.
- Current Assignee: APPLIED MATERIALS ISRAEL LTD.
- Current Assignee Address: IL Rehovot
- Agency: Kilpatrick Townsend & Stockton LLP
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N21/88 ; G01Q10/06 ; G01Q20/02 ; G01Q60/06 ; G01Q70/06 ; G01Q60/24

Abstract:
There may be provided an evaluation system that may include spatial sensors that include atomic force microscopes (AFMs) and a solid immersion lens. The AFMs are arranged to generate spatial relationship information that is indicative of a spatial relationship between the solid immersion lens and a substrate. The controller is arranged to receive the spatial relationship information and to send correction signals to the at least one location correction element for introducing a desired spatial relationship between the solid immersion lens and the substrate.
Public/Granted literature
- US20160077016A1 EVALUATION SYSTEM AND A METHOD FOR EVALUATING A SUBSTRATE Public/Granted day:2016-03-17
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