Invention Grant
- Patent Title: Magnetic measurement system and apparatus utilizing X-ray to measure comparatively thick magnetic materials
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Application No.: US15471412Application Date: 2017-03-28
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Publication No.: US09835569B2Publication Date: 2017-12-05
- Inventor: Masao Yano , Kanta Ono
- Applicant: TOYOTA JIDOSHA KABUSHIKI KAISHA , INTER-UNIVERSITY RESEARCH INSTITUTE CORPORATION HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION
- Applicant Address: JP Toyotoa-Shi JP Tsukuba-Shi
- Assignee: TOYOTA JIDOSHA KABUSHIKI KAISHA,INTER-UNIVERSITY RESEARCH INSTITUTE CORPORATION HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION
- Current Assignee: TOYOTA JIDOSHA KABUSHIKI KAISHA,INTER-UNIVERSITY RESEARCH INSTITUTE CORPORATION HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION
- Current Assignee Address: JP Toyotoa-Shi JP Tsukuba-Shi
- Agency: Westerman, Hattori, Daniels & Adrian, LLP
- Priority: JP2013-198163 20130925
- Main IPC: G01R33/12
- IPC: G01R33/12 ; G01N23/083

Abstract:
A magnetic measurement system includes an X-ray source, a monochromator that converts right- and left-polarization X-ray into right- and left-monochromatic X-ray, an aperture slit that allows the right- and left-monochromatic X-ray to pass through, an analytical section, and piezoelectric scanning devices. The analytical section has a Fresnel zone plate that receives and focuses the right- and left-monochromatic X-ray on a single point being 10 nm or less wide of a magnetic sample, an order-sorting aperture that allows the focused X-ray to selectively pass through, a sample-stage that sets a comparatively thick magnetic sample that is more than 150 nm thick and less than or equal to 1000 nm thick to be irradiated with the X-ray, and an X-ray-detector that detects transmittance of transmission X-ray passing through the comparatively thick sample and that generates X-ray magnetic circular dichroism (XMCD) data by directly measuring the detected transmittance of the transmission X-ray.
Public/Granted literature
- US20170199135A1 MAGNETIC MEASUREMENT SYSTEM AND APPARATUS FOR MEASURING COMPARATIVELY THICK MATERIALS Public/Granted day:2017-07-13
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