Invention Grant
- Patent Title: Circuit and method for impedance detection in millimeter wave systems
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Application No.: US14682629Application Date: 2015-04-09
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Publication No.: US09835714B2Publication Date: 2017-12-05
- Inventor: Krishnanshu Dandu , Brian P. Ginsburg
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent Ronald O. Neerings; Charles A. Brill; Frank D. Cimino
- Main IPC: G01S7/285
- IPC: G01S7/285 ; G01S7/40 ; G01S13/42 ; G01S13/02

Abstract:
A method for determining the complex impedance between a first stage and a second stage in a microwave system includes detecting an incident signal emitted by the first stage and detecting a reflected signal reflected from the second stage. The magnitudes of the incident signal and the reflected signal are measured. The detected incident signal is phase shifted by a first angle to yield a first incident signal and the detected reflected signal is phase shifted by the first angle to yield a first reflected signal. The detected incident signal and the first incident signal are mixed with the detected reflected signal and the first reflected signal. The angle of the reflection coefficient is determined based on the mixing and the magnitudes of the incident signal and the reflected signals.
Public/Granted literature
- US20160299215A1 CIRCUIT AND METHOD FOR IMPEDANCE DETECTION IN MILLIMETER WAVE SYSTEMS Public/Granted day:2016-10-13
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