Invention Grant
- Patent Title: Digtial circuit structures to control leakage current
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Application No.: US14985397Application Date: 2015-12-31
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Publication No.: US09837130B2Publication Date: 2017-12-05
- Inventor: Hidehiro Fujiwara , Chih-Yu Lin , Wei-Cheng Wu , Yen-Huei Chen , Hung-Jen Liao
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Current Assignee Address: TW Hsinchu
- Agency: WPAT, P.C., Intellectual Property Attorneys
- Agent Anthony King
- Main IPC: G11C7/00
- IPC: G11C7/00 ; G11C7/02 ; G11C11/412 ; G11C11/419

Abstract:
In accordance with some embodiments of the present disclosure, a circuit structure is provided. The circuit structure comprises a first transistor, a second transistor, a storage node and a word-line. Each of the two transistors comprises a gate, a source and a drain. The storage node is connected to the gate of the first transistor. The word-line is connected to the gate of the second transistor. The first and second transistors are serially connected. The first and second threshold voltages are respectively associated with the first and second transistors, and the first threshold voltage is lower than the second threshold voltage.
Public/Granted literature
- US20170194037A1 DIGTIAL CIRCUIT STRUCTURES TO CONTROL LEAKAGE CURRENT Public/Granted day:2017-07-06
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