Invention Grant
- Patent Title: Nonvolatile memory device, storage device having the same, and operation and read methods thereof
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Application No.: US15146911Application Date: 2016-05-05
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Publication No.: US09837164B2Publication Date: 2017-12-05
- Inventor: Sung-Won Yun
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR10-2014-0052578 20140430
- Main IPC: G11C11/34
- IPC: G11C11/34 ; G11C16/34 ; G11C16/26 ; G11C16/04 ; G11C16/24 ; G11C11/56 ; G11C16/10 ; G11C16/14 ; G11C16/30

Abstract:
A method is for operating a nonvolatile memory device, the nonvolatile memory device including at least one string connected to a bit line, the at least one string including a plurality of memory cells connected in series, each of the plurality of memory cells being connected to a respective word line among a plurality of word lines and stacked in a direction perpendicular to a substrate. The method includes applying a word line voltage needed for an operation to a first word line among the word lines, applying a recovery voltage higher than a ground voltage to the first word line after the operation, and then floating the first word line.
Public/Granted literature
- US20160247578A1 NONVOLATILE MEMORY DEVICE, STORAGE DEVICE HAVING THE SAME, AND OPERATION AND READ METHODS THEREOF Public/Granted day:2016-08-25
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