Invention Grant
- Patent Title: Semiconductor device, manufacturing method thereof, and display device including the semiconductor device
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Application No.: US15340031Application Date: 2016-11-01
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Publication No.: US09837512B2Publication Date: 2017-12-05
- Inventor: Junichi Koezuka , Kenichi Okazaki , Daisuke Kurosaki , Yukinori Shima , Yasuharu Hosaka
- Applicant: Semiconductor Energy Laboratory Co., Ltd.
- Applicant Address: JP Atsugi-shi, Kanagawa-ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Atsugi-shi, Kanagawa-ken
- Agency: Fish & Richardson P.C.
- Priority: JP2014-144659 20140715; JP2015-010055 20150122
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L29/66 ; H01L29/786 ; H01L21/02 ; H01L27/12

Abstract:
The transistor includes a gate electrode, a gate insulating film over the gate electrode, an oxide semiconductor film over the gate insulating film, a source electrode and a drain electrode electrically connected to the oxide semiconductor film. The oxide semiconductor film includes a first oxide semiconductor film on the gate electrode side and a second oxide semiconductor film over the first oxide semiconductor film. The first oxide semiconductor film includes a first region in which an atomic proportion of In is larger than that of M (M is Ti, Ga, Sn, Y, Zr, La, Ce, Nd, or Hf). The second oxide semiconductor film includes a second region in which an atomic proportion of In is smaller than that of the first oxide semiconductor film. The second region includes a portion thinner than the first region.
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