Invention Grant
- Patent Title: Auto frequency calibration method
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Application No.: US15341183Application Date: 2016-11-02
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Publication No.: US09838024B2Publication Date: 2017-12-05
- Inventor: Yen-Jen Chen , Feng Wei Kuo , Huan-Neng Chen , Chewn-Pu Jou
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee Address: TW Hsinchu
- Agency: Hauptman Ham, LLP
- Main IPC: H03L7/06
- IPC: H03L7/06 ; H03L7/08 ; H03L7/10 ; H03L7/197 ; G04F10/00 ; H03L7/085 ; H03L7/099 ; H03M1/00 ; H03L7/093 ; H03M3/00

Abstract:
A method of generating an output signal includes determining a sampling period N according to a number of most significant bits (MSBs) of a divider number control signal. The method also includes determining a first logic value of a control signal by a comparing circuit based on the sampling period N, and generating a coarse tuning signal by a code generating circuit based on a phase difference signal and the control signal. When an M-th least significant bit (LSB) of the number of MSBs of the divider number control signal equals a second logic value, the sampling period N is set based on the M-th LSB of the number of MSBs of the divider number control signal.
Public/Granted literature
- US20170077932A1 AUTO FREQUENCY CALIBRATION METHOD Public/Granted day:2017-03-16
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