Invention Grant
- Patent Title: System and method for machine parameter analysis in wireless field units
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Application No.: US14558634Application Date: 2014-12-02
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Publication No.: US09839069B2Publication Date: 2017-12-05
- Inventor: James Girardeau , Timothy L. Rohrer
- Applicant: Uptime Solutions Inc.
- Applicant Address: US FL Jacksonville
- Assignee: UPTIME SOLUTIONS
- Current Assignee: UPTIME SOLUTIONS
- Current Assignee Address: US FL Jacksonville
- Main IPC: G06F19/00
- IPC: G06F19/00 ; H04W84/18 ; H04W4/00

Abstract:
A sensor sampling system comprises a field unit to receive at least one analysis parameter from a base station and a signal representing a machine parameter monitored by a machine sensor. The field unit analyzes the signal based on the at least one machine parameter to generate a representation of the machine parameter, and wirelessly transmits the representation of the machine parameter for reception by the base station.
Public/Granted literature
- US20150366001A1 SYSTEM AND METHOD FOR MACHINE PARAMETER ANALYSIS IN WIRELESS FIELD UNITS Public/Granted day:2015-12-17
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