- Patent Title: System of inspecting focus ring and method of inspecting focus ring
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Application No.: US15179306Application Date: 2016-06-10
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Publication No.: US09841395B2Publication Date: 2017-12-12
- Inventor: Kippei Sugita , Tomohide Minami
- Applicant: TOKYO ELECTRON LIMITED
- Applicant Address: JP Tokyo
- Assignee: TOKYO ELECTRON LIMITED
- Current Assignee: TOKYO ELECTRON LIMITED
- Current Assignee Address: JP Tokyo
- Agency: Pearne & Gordon LLP
- Priority: JP2015-118183 20150611
- Main IPC: G01N27/24
- IPC: G01N27/24 ; G01R27/26 ; G01R31/28 ; H01J37/32 ; G01R31/3185 ; G01R31/265

Abstract:
A system of inspecting a focus ring is provided. The system includes a measuring device, a transfer device and an operation unit. The measuring device includes a base substrate, a sensor chip and a circuit board. The sensor chip has a sensor electrode and is provided along an edge of the base substrate. The circuit board is configured to output a high frequency signal to the sensor electrode and acquire a digital value indicating electrostatic capacitance based on a voltage amplitude in the sensor electrode. The transfer device is configured to scan the measuring device. The operation unit is configured to obtain difference values by performing a difference operation with respect to the digital values acquired by the measuring device at multiple positions along a direction which intersects with an inner periphery of the focus ring.
Public/Granted literature
- US20160363556A1 SYSTEM OF INSPECTING FOCUS RING AND METHOD OF INSPECTING FOCUS RING Public/Granted day:2016-12-15
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