Invention Grant
- Patent Title: Method and device for automatically identifying a point of interest on a viewed object
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Application No.: US15018587Application Date: 2016-02-08
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Publication No.: US09842430B2Publication Date: 2017-12-12
- Inventor: Clark Alexander Bendall
- Applicant: General Electric Company
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: Barclay Damon LLP
- Main IPC: G06T17/00
- IPC: G06T17/00 ; G01B11/30 ; G01N21/88 ; G06T7/00 ; G06K9/00 ; G01B11/24

Abstract:
A method and device for automatically identifying a point of interest (e.g., the deepest or highest point) on a viewed object using a video inspection device. The method involves placing a first cursor on an image of the object to establish a first slice plane and first surface contour line, as well as placing another cursor, offset from the first cursor, used to establish an offset (second) slice plane and an offset (second) surface contour line. Profile slice planes and profile surface contour lines are then determined between corresponding points on the first surface contour line and the offset (second) surface contour line to automatically identify the point of interest.
Public/Granted literature
- US20160155015A1 METHOD AND DEVICE FOR AUTOMATICALLY IDENTIFYING A POINT OF INTEREST ON A VIEWED OBJECT Public/Granted day:2016-06-02
Information query
IPC分类:
G | 物理 |
G06 | 计算;推算或计数 |
G06T | 一般的图像数据处理或产生 |
G06T17/00 | 用于计算机制图的3D建模 |