Invention Grant
- Patent Title: Nonvolatile memory device with improved reliability and operating speed
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Application No.: US14996249Application Date: 2016-01-15
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Publication No.: US09842654B2Publication Date: 2017-12-12
- Inventor: Ji-Sang Lee , Donghun Kwak , Daeseok Byeon , Chiweon Yoon
- Applicant: Ji-Sang Lee , Donghun Kwak , Daeseok Byeon , Chiweon Yoon
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR10-2015-0095752 20150706
- Main IPC: G11C11/34
- IPC: G11C11/34 ; G11C16/10 ; G11C16/26 ; G11C16/04 ; G11C16/24 ; G11C11/56

Abstract:
A nonvolatile memory includes a memory cell array, a row decoder circuit, and a page buffer circuit. The row decoder circuit applies a turn-on voltage to string selection lines, which are connected to string selection transistors of a selected memory block, at a first precharge operation in response to a write command received from an external device. The page buffer circuit applies, in response to the write command, a first voltage to bit lines, which are connected to the string selection transistors, through a first precharge circuit at the first precharge operation regardless of loaded data and applies the first voltage and a second voltage to the bit lines through a second precharge circuit at a second precharge operation based on the loaded data. During the first precharge operation, write data is loaded onto the page buffer circuit.
Public/Granted literature
- US20170011799A1 NONVOLATILE MEMORY DEVICE Public/Granted day:2017-01-12
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