Invention Grant
- Patent Title: Methods of operating nonvolatile memory devices including variable verification voltages based on program/erase cycle information
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Application No.: US15132737Application Date: 2016-04-19
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Publication No.: US09842658B2Publication Date: 2017-12-12
- Inventor: Chang-Hyun Lee
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Myers Bigel, P.A.
- Priority: KR10-2015-0054995 20150420
- Main IPC: G11C16/34
- IPC: G11C16/34 ; G11C16/16 ; G11C16/04 ; G11C16/10 ; G11C11/56

Abstract:
Methods of operating a nonvolatile memory device include performing erase loops on a memory block using a first voltage, performing program loops on memory cells of the memory block using a second voltage, and increasing the first and second voltages based on program/erase cycle information for the memory cells. The first voltage may include an erase verification voltage and the second voltage may include a program voltage.
Public/Granted literature
- US20160307633A1 NONVOLATILE MEMORY DEVICES AND METHODS OF OPERATING THE SAME Public/Granted day:2016-10-20
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