Invention Grant
- Patent Title: Non-volatile memory device for detecting progressive error, memory system, and method of operating the non-volatile memory device
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Application No.: US14616281Application Date: 2015-02-06
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Publication No.: US09842659B2Publication Date: 2017-12-12
- Inventor: Sang-wan Nam , Byung-gil Jeon , Dae-seok Byeon
- Applicant: Sang-wan Nam , Byung-gil Jeon , Dae-seok Byeon
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey, & Pierce, P.L.C.
- Priority: KR10-2014-0041498 20140407
- Main IPC: G11C11/34
- IPC: G11C11/34 ; G11C29/02 ; G11C29/12 ; G11C29/50

Abstract:
Provided are a non-volatile memory device, a memory system, and a method of operating the non-volatile memory device. The method includes: performing a user operation according to at least one mode selected from among a writing mode, a reading mode, and an erasing mode with respect to a memory cell array; setting up voltages of a plurality of word lines; floating at least one word line from among the plurality of word lines, the voltages of which are set up, according to the at least one selected mode; and detecting whether the at least one word line has a progressive defect, according to a result of detecting a voltage level of the at least one floated word line.
Public/Granted literature
- US20150287479A1 NON-VOLATILE MEMORY DEVICE, MEMORY SYSTEM, AND METHOD OF OPERATING THE NON-VOLATILE MEMORY DEVICE Public/Granted day:2015-10-08
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