Invention Grant
- Patent Title: Methods of calibrating linear-logarithmic image sensors
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Application No.: US14224198Application Date: 2014-03-25
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Publication No.: US09843750B2Publication Date: 2017-12-12
- Inventor: Yoel Yaffe , Claudio G. Jakobson , Shemi Prazot , Uzi Hizi
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Myers Bigel, P.A.
- Main IPC: H04N5/232
- IPC: H04N5/232 ; H04N5/365 ; H04N5/374 ; H04N17/00 ; H04N5/355 ; H01L27/146

Abstract:
Methods of calibrating a linear-logarithmic image sensor pixel include performing a reset of the pixel in advance of establishing a leakage current between a photodiode and a floating diffusion region of the pixel. A first voltage of the floating diffusion region is then read through a source follower and selection transistor, after the leakage is terminated. A step is then performed to transfer charge between the photodiode and the floating diffusion region of the pixel so that a voltage of a cathode of the photodiode is increased. Thereafter, a second voltage of the floating diffusion region is read. The first and second read voltages are then used to perform a calibration operation. These steps may be repeated to establish another leakage current of different duration/magnitude and yield third and fourth read voltages, which support further calibration.
Public/Granted literature
- US20150281683A1 METHODS OF CALIBRATING LINEAR-LOGARITHMIC IMAGE SENSORS Public/Granted day:2015-10-01
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