- Patent Title: Monte Carlo simulation for analyzing yield of an electric circuit
-
Application No.: US14215577Application Date: 2014-03-17
-
Publication No.: US09846753B2Publication Date: 2017-12-19
- Inventor: Jin-Young Lee , Chang-Ho Han
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Onello & Mello LLP
- Priority: KR10-2013-0059878 20130527
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
In a simulation system and method thereof, the simulation includes, when a function value for a nominal point (NP) of an input is a first value, running a first simulation on the input; and when the function value for the NP of the input is a second value different from the first value, running a second simulation on the input. Here, the running of the second simulation may include (a) setting a boundary of an input distribution for the second value as a first distribution value, (b) generating input samples within the set boundary of the input distribution, (c) obtaining a worst case point (WCP) for the input by performing machine learning on the generated input samples, and (d) repeatedly performing the steps (a) to (c) while shifting the boundary of the input distribution until the boundary of the input distribution reaches a minimum critical value.
Public/Granted literature
- US20140350900A1 SIMULATION SYSTEM AND METHOD THEREOF AND COMPUTING SYSTEM INCLUDING THE SIMULATION SYSTEM Public/Granted day:2014-11-27
Information query