Invention Grant
- Patent Title: Method and apparatus for determining nonlinear characteristic and system
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Application No.: US15265360Application Date: 2016-09-14
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Publication No.: US09853767B2Publication Date: 2017-12-26
- Inventor: Hao Chen , Zhenning Tao
- Applicant: FUJITSU LIMITED
- Applicant Address: JP Kawasaki
- Assignee: FUJITSU LIMITED
- Current Assignee: FUJITSU LIMITED
- Current Assignee Address: JP Kawasaki
- Agency: Staas & Halsey LLP
- Priority: CN201510586807 20150915
- Main IPC: G06F17/50
- IPC: G06F17/50 ; H04L1/00 ; H04L25/03 ; H04L5/00

Abstract:
Embodiments of the present disclosure provide a method and apparatus for determining a nonlinear characteristic and a system. The method for determining a nonlinear characteristic includes: determining a correction factor of a nonlinear item of a nonlinear model of a system to be measured according to an input and/or a parameter of the system to be measured; correcting the nonlinear item of a nonlinear model of the system to be measured by using the correction factor; and obtaining a nonlinear characteristic of the system to be measured according to the corrected nonlinear model. The nonlinear characteristic allows the input and/or the parameter of the system to be corrected to produce a corrected output. With the embodiments of the present disclosure, the nonlinear characteristic of the system to be measured under different inputs and/or parameters may be estimated, and accuracy of the estimation and applicability are improved.
Public/Granted literature
- US20170078046A1 METHOD AND APPARATUS FOR DETERMINING NONLINEAR CHARACTERISTIC AND SYSTEM Public/Granted day:2017-03-16
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