Invention Grant
- Patent Title: Silicon photomultipliers with internal calibration circuitry
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Application No.: US14574836Application Date: 2014-12-18
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Publication No.: US09854231B2Publication Date: 2017-12-26
- Inventor: Jianjun Guo , Sergei Ivanovich Dolinsky
- Applicant: General Electric Company
- Applicant Address: US NY Niskayuna
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Niskayuna
- Agent Pabitra K. Chakrabarti
- Main IPC: H01L27/00
- IPC: H01L27/00 ; H04N17/00 ; H04N5/341 ; G01T1/20 ; G01T1/208 ; G01T1/24

Abstract:
A silicon photomultiplier includes a plurality of microcells providing a pulse output in response to an incident radiation, each microcell including circuitry configured to enable and disable the pulse output. Each microcell includes a cell disable switch. The control logic circuit controls the cell disable switch and a self-test circuit. A microcell's pulse output is disabled when the cell disable switch is in a first state. A method for self-test calibration of microcells includes providing a test enable signal to the microcells, integrating dark current for a predetermined time period, comparing the integrated dark current to a predetermined threshold level, and providing a signal if above the predetermined threshold level.
Public/Granted literature
- US20160182902A1 SILICON PHOTOMULTIPLIERS WITH INTERNAL CALIBRATION CIRCUITRY Public/Granted day:2016-06-23
Information query
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