Invention Grant
- Patent Title: Thermographic characterization for surface finishing process development
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Application No.: US14638892Application Date: 2015-03-04
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Publication No.: US09855637B2Publication Date: 2018-01-02
- Inventor: Lucas Allen Whipple , Simon Regis Louis Lancaster-Larocque , Collin D. Chan , Christopher R. Fagan , Vincent Yan , Ian S. Theilacker , Brian K. Miehm , Shravan Bharadwaj
- Applicant: Apple Inc.
- Applicant Address: US CA Cupertino
- Assignee: Apple Inc.
- Current Assignee: Apple Inc.
- Current Assignee Address: US CA Cupertino
- Agency: Downey Brand LLP
- Main IPC: B24B49/14
- IPC: B24B49/14 ; B24B49/12 ; B24B49/16 ; B24B49/00 ; B24B37/015

Abstract:
A method and system for observing and monitoring thermal characteristics of a machining operation, such as a surface finishing operation, performed on a workpiece is disclosed. The surface finishing operation can be performed on the workpiece in order to remove a surface defect, e.g. a parting line, on a surface of the workpiece and/or to provide a mirror-like finish to the workpiece. In one embodiment, an emissive layer is applied to the workpiece to increase a thermal emissivity of the workpiece. In some embodiments, a finishing surface, such as a polishing or buffing wheel, and/or a lubricant used in a finishing operation is monitored. A thermal profile of the surface of the workpiece, finishing surface and/or lubricant can be obtained. The finishing operation can be modified in response to the monitored thermal characteristics to prevent the occurrence of defects and improve the efficacy of the finishing operation.
Public/Granted literature
- US20150290764A1 THERMOGRAPHIC CHARACTERIZATION FOR SURFACE FINISHING PROCESS DEVELOPMENT Public/Granted day:2015-10-15
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