Invention Grant
- Patent Title: Bonded wafer structures
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Application No.: US14112138Application Date: 2011-05-09
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Publication No.: US09856137B2Publication Date: 2018-01-02
- Inventor: Rodney L. Alley , Donald J. Milligan
- Applicant: Rodney L. Alley , Donald J. Milligan
- Applicant Address: US TX Houston
- Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee Address: US TX Houston
- Agency: Brooks, Cameron & Huebsch, PLLC
- International Application: PCT/US2011/035697 WO 20110509
- International Announcement: WO2012/154165 WO 20121115
- Main IPC: B81B7/00
- IPC: B81B7/00 ; H01L21/20 ; H01L21/50 ; B81C1/00

Abstract:
The present disclosure includes bonded wafer structures and methods of forming bonded wafer structures. One example of a forming a bonded wafer structure includes providing a first wafer (202, 302) and a second wafer (204, 304) to be bonded together via a bonding process that has a predetermined wafer gap (216, 316) associated therewith, and forming a mesa (215, 315, 415) on the first wafer (202, 302) prior to bonding the first wafer (202, 302) and the second wafer (204, 304) together, wherein a height (220, 320, 420) of the mesa (215, 315, 415) is determined based on a target element gap (217, 317) associated with the bonded wafer structure.
Public/Granted literature
- US20140042596A1 BONDED WAFER STRUCTURES Public/Granted day:2014-02-13
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