Invention Grant
- Patent Title: Minute object characteristics measuring apparatus
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Application No.: US14980706Application Date: 2015-12-28
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Publication No.: US09857216B2Publication Date: 2018-01-02
- Inventor: Daichi Yamaguchi , Shuusuke Someno
- Applicant: Daichi Yamaguchi , Shuusuke Someno
- Applicant Address: JP Tokyo
- Assignee: Ricoh Company, Ltd.
- Current Assignee: Ricoh Company, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2014-263976 20141226; JP2015-213591 20151030; JP2015-241945 20151211
- Main IPC: G01H17/00
- IPC: G01H17/00 ; G01Q20/02

Abstract:
A minute object characteristics measuring apparatus is provided. The minute object characteristics measuring apparatus includes a holder, a cantilever, a measuring device, and a driver. The holder holds a minute object. The cantilever faces the minute object held by the holder. The measuring device measures a displacement of the cantilever. The driver drives one of the holder holding the minute object and the cantilever in a direction that the minute object held by the holder and the cantilever are brought close to or drawn away from each other.
Public/Granted literature
- US20160187374A1 MINUTE OBJECT CHARACTERISTICS MEASURING APPARATUS Public/Granted day:2016-06-30
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