Invention Grant
- Patent Title: Leak testing apparatus and method
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Application No.: US14909768Application Date: 2014-10-14
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Publication No.: US09857264B2Publication Date: 2018-01-02
- Inventor: Takaaki Watanabe , Tsutomu Hara , Naohiko Maruno
- Applicant: Fukuda Co., Ltd.
- Applicant Address: JP Tokyo
- Assignee: Fukuda Co., Ltd.
- Current Assignee: Fukuda Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Harter Secrest & Emery LLP
- Agent Thomas B. Ryan
- Priority: JP2013-214556 20131015
- International Application: PCT/JP2014/077285 WO 20141014
- International Announcement: WO2015/056661 WO 20150423
- Main IPC: G01M3/20
- IPC: G01M3/20 ; G01M3/22 ; G01M3/32

Abstract:
In leak testing by an accumulation method, it is possible to reliably detect accumulated inspection gas, and the reliability of leak testing is enhanced by reduction in background or impurity gas. At least an openable/closeable part 29 of a capsule 20 is housed inside a chamber 10 of a leak testing apparatus 1. A test workpiece 9 is housed in the capsule 20. Gas inside the chamber 10 is evacuated by a vacuum pump 31. A detector 2 detects inspection gas contained in this gas. The capsule 20 is continuously sealed for an accumulation time Ta, the capsule 20 is thereafter opened, and a leak is evaluated on the basis of detection information after the opening by the detector 2.
Public/Granted literature
- US20160178472A1 Leak Testing Apparatus and Method Public/Granted day:2016-06-23
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