Invention Grant
- Patent Title: Debugging circuit, debugger device, and debugging method
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Application No.: US14724052Application Date: 2015-05-28
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Publication No.: US09857423B2Publication Date: 2018-01-02
- Inventor: Yutaka Tamiya
- Applicant: FUJITSU LIMITED
- Applicant Address: JP Kawasaki
- Assignee: FUJITSU LIMITED
- Current Assignee: FUJITSU LIMITED
- Current Assignee Address: JP Kawasaki
- Agency: Fujitsu Patent Center
- Priority: JP2014-169042 20140822
- Main IPC: G06F11/26
- IPC: G06F11/26 ; G01R31/317 ; G06F11/36

Abstract:
A debugging circuit including: a storage configured to store a first code value which is calculated by an encoding method in which a value is changed according to a sequence of a signal in a debugging target circuit, and indicates a stop condition of the debugging target circuit; a code value calculator configured to calculate a second code value by the encoding method based on the signal each time when the signal is changed; and an operation stopper configured to stop an operation of the debugging target circuit when the first code value and the second code value are identical to each other.
Public/Granted literature
- US20160054388A1 DEBUGGING CIRCUIT, DEBUGGER DEVICE, AND DEBUGGING METHOD Public/Granted day:2016-02-25
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