Invention Grant
- Patent Title: Method for determining location of short-circuit point in raster device
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Application No.: US14777665Application Date: 2014-12-04
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Publication No.: US09857612B2Publication Date: 2018-01-02
- Inventor: Yanbing Wu
- Applicant: BOE TECHNOLOGY GROUP CO., LTD.
- Applicant Address: CN Beijing
- Assignee: BOE TECHNOLOGY GROUP CO., LTD.
- Current Assignee: BOE TECHNOLOGY GROUP CO., LTD.
- Current Assignee Address: CN Beijing
- Agency: Dilworth & Barrese, LLP.
- Agent Michael J. Musella, Esq.
- Priority: CN201410449167 20140904
- International Application: PCT/CN2014/093067 WO 20141204
- International Announcement: WO2016/033892 WO 20160310
- Main IPC: G02F1/13
- IPC: G02F1/13 ; G01R31/02 ; G02F1/1343

Abstract:
A method for determining location of a short-circuit point in a raster device comprises: applying a first DC voltage signal to a common electrode layer in the raster device; applying a second DC voltage signal to only first transparent electrodes in the raster device, or a second DC voltage signal to only second transparent electrodes in the raster device, or a second DC voltage signal to both the first transparent electrodes and the second transparent electrodes in the raster device, an absolute value of a difference between a voltage value of the first DC voltage signal and a voltage value of the second DC voltage signal being not lower than a liquid crystal deflection threshold voltage value (501); acquiring grayscale values of corresponding display areas in the raster device and determining the location of the short-circuit point according to the acquired grayscale values (502). The method provides a solution for determining the location of the short-circuit point which is in contact with the first transparent electrode and the second transparent electrode simultaneously.
Public/Granted literature
- US20160259188A1 METHOD FOR DETERMINING LOCATION OF SHORT-CIRCUIT POINT IN RASTER DEVICE Public/Granted day:2016-09-08
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