Invention Grant
- Patent Title: Test support apparatus, test support method, and test support program for plant monitoring system
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Application No.: US14571749Application Date: 2014-12-16
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Publication No.: US09858692B2Publication Date: 2018-01-02
- Inventor: Tadao Konishi , Motoko Yoshida , Naoto Odagawa
- Applicant: KABUSHIKI KAISHA TOSHIBA
- Applicant Address: JP Minato-ku
- Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee Address: JP Minato-ku
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2014-004522 20140114
- Main IPC: G06T11/20
- IPC: G06T11/20 ; G05B23/02 ; G21C17/00

Abstract:
A test support apparatus for a plant monitoring system, includes: a list holding unit configured to hold a test list which describes at least a plurality of test items and information about a testing sequence for the test items; a screen generating unit configured to generate a display screen provided based on an output signal from a control unit which controls a plurality of connected devices; a data acquisition instructing unit configured to give instructions to acquire image data of the display screen based on the testing sequence in the test list; and a data linking unit configured to link the acquired image data to the test items on the test list.
Public/Granted literature
- US20150199831A1 TEST SUPPORT APPARATUS, TEST SUPPORT METHOD, AND TEST SUPPORT PROGRAM FOR PLANT MONITORING SYSTEM Public/Granted day:2015-07-16
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