Invention Grant
- Patent Title: Non-volatile memory device and memory system including the same
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Application No.: US15251345Application Date: 2016-08-30
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Publication No.: US09859015B2Publication Date: 2018-01-02
- Inventor: Tae-Hyun Kim , Bong-Soon Lim , Yoon-Hee Choi , Sang-Won Shim
- Applicant: Tae-Hyun Kim , Bong-Soon Lim , Yoon-Hee Choi , Sang-Won Shim
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR10-2015-0148025 20151023
- Main IPC: G11C16/04
- IPC: G11C16/04 ; G11C16/34 ; G11C16/08 ; G11C16/26 ; G11C16/10 ; G06F11/10 ; G11C29/52

Abstract:
A memory device has a memory cell array with memory cells. A page buffer group generates page buffer signals according to a verify read result of the memory cells. A page buffer decoding unit generates a decoder output signal corresponding to the number of fail bits from the page buffer signals based on a first reference current. A slow bit counter outputs a count result corresponding to the number of fail bits from the decoder output signal based on a second reference current corresponding to M times the first reference current, where M is a positive integer. A pass/fail checking unit determines a program outcome with respect to the memory cells based on the count result and outputs a pass signal or a fail signal based on the determined program outcome.
Public/Granted literature
- US20170117055A1 NON-VOLATILE MEMORY DEVICE AND MEMORY SYSTEM INCLUDING THE SAME Public/Granted day:2017-04-27
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