Invention Grant
- Patent Title: Apparatus and method for temperature measurement and/or calibration via resonant peaks in an oscillator
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Application No.: US14188075Application Date: 2014-02-24
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Publication No.: US09859872B2Publication Date: 2018-01-02
- Inventor: Adam Malpass
- Applicant: Dialog Semiconductor GmbH
- Applicant Address: GB Reading
- Assignee: Dialog Semiconductor (UK) Limited
- Current Assignee: Dialog Semiconductor (UK) Limited
- Current Assignee Address: GB Reading
- Agency: Saile Ackerman LLC
- Agent Stephen B. Ackerman
- Priority: EP14368017 20140214
- Main IPC: H03K3/011
- IPC: H03K3/011 ; H03K3/012 ; G01K7/32 ; G01K15/00

Abstract:
An apparatus and method for a temperature and calibration utilizing resonant frequency peaks in an oscillator. A circuit providing resonant peaks for utilization for temperature measurements comprising a resonator device for providing an oscillating source, a variable gain-bandwidth amplifier in parallel with the crystal/resonator for providing modulation of the gain and/or bandwidth driving the crystal/resonator, and control of resonant peaks for selection for oscillation, a first capacitor electrically coupled to the parallel combination of the input of the variable gain-bandwidth amplifier, and the resonator device for providing charge storage for oscillation, and a second capacitor electrically coupled to parallel combination of the output of the variable gain-bandwidth amplifier, and the resonator device for providing charge storage for oscillation.
Public/Granted literature
- US20150236673A1 Apparatus and Method for Temperature Measurement and/or Calibration Via Resonant Peaks in an Oscillator Public/Granted day:2015-08-20
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