Invention Grant
- Patent Title: Wavefront analyser
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Application No.: US14899563Application Date: 2014-06-20
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Publication No.: US09861277B2Publication Date: 2018-01-09
- Inventor: Trevor Bruce Anderson , Steven James Frisken , Grant Andrew Frisken , Armin Georg Segref
- Applicant: Cylite Pty Ltd
- Agent Darren Gardner
- Priority: AU2013902254 20130620
- International Application: PCT/AU2014/000638 WO 20140620
- International Announcement: WO2014/201504 WO 20141224
- Main IPC: A61B3/14
- IPC: A61B3/14 ; A61B3/00 ; A61B3/10 ; G01B9/02 ; G01J9/02 ; A61B3/117 ; A61B3/107 ; G02B27/10 ; G02B27/28 ; G02C7/02

Abstract:
Interferometry-based methods and apparatus are presented for analyzing one or more wavefronts from a sample, in which the sample wavefronts are interfered with two or more reference wavefronts to produce two or more interferograms in a sufficiently short time period for the interferograms to be captured in a single exposure of an image capture device such as a CCD array. Each interferogram has a unique carrier frequency dependent on the angle between a respective pair of sample and reference wavefronts. In certain embodiments multiple sample and/or reference wavefronts are generated using scanning mirrors, while in other embodiments utilizing multi-wavelength beams multiple sample and/or reference wavefronts are generated with wavelength dispersive elements. The methods and apparatus are suitable for measuring aberrations at one or more positions on the retina of an eye.
Public/Granted literature
- US20160135680A1 WAVEFRONT ANALYSER Public/Granted day:2016-05-19
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