Invention Grant
- Patent Title: System and method for testing track circuits
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Application No.: US14501852Application Date: 2014-09-30
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Publication No.: US09862395B2Publication Date: 2018-01-09
- Inventor: Nick Nagrodsky , Jeffrey Fries , Aric Weingartner
- Applicant: GENERAL ELECTRIC COMPANY
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: Global Patent Operation
- Agent John A. Kramer
- Main IPC: B61L1/18
- IPC: B61L1/18 ; B61L23/04

Abstract:
A system includes a track system having a first rail and a second rail, a track activity detection circuit electrically connected to each of the first rail and the second rail, a track shunt circuit electrically connected to the first rail and the second rail, wherein the track shunt circuit is configured to selectively electrically connect the first rail and the second rail through a shunt. A method includes receiving an instruction to apply a shunt between a first rail and a second rail of a track system, and electrically connecting the first rail to the second rail through a controllable track shunt circuit.
Public/Granted literature
- US20160090113A1 SYSTEM AND METHOD FOR TESTING TRACK CIRCUITS Public/Granted day:2016-03-31
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