Invention Grant
- Patent Title: Tool length measurement apparatus
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Application No.: US15044364Application Date: 2016-02-16
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Publication No.: US09863765B2Publication Date: 2018-01-09
- Inventor: Ken Onoe , Akira Kimura
- Applicant: DMG Mori Seiki Co., Ltd.
- Applicant Address: JP Nara
- Assignee: DMG Mori Seiki Co., Ltd.
- Current Assignee: DMG Mori Seiki Co., Ltd.
- Current Assignee Address: JP Nara
- Agency: Fish & Richardson P.C.
- Priority: JP2015-028938 20150217
- Main IPC: G01B21/02
- IPC: G01B21/02 ; B23Q17/00

Abstract:
This invention reliably returns a measurement surface to a reference position while weakening the elastic force of a spring. A tool length measurement apparatus of this invention includes a supporter that supports the measurement surface that the tip of a tool contacts while translating in accordance with a biasing force received from the tool. The tool length measurement apparatus of this invention also includes a detector that detects the position of the measurement surface in a translation direction. The tool length measurement apparatus of this invention also includes a biasing unit that biases the measurement surface by a gas in a direction against the biasing force received from the tool.
Public/Granted literature
- US20160238366A1 TOOL LENGTH MEASUREMENT APPARATUS Public/Granted day:2016-08-18
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