Invention Grant
- Patent Title: Calibration of a contact probe
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Application No.: US14900036Application Date: 2014-06-26
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Publication No.: US09863766B2Publication Date: 2018-01-09
- Inventor: David S Wallace , Jean-Louis Grzesiak
- Applicant: RENISHAW PLC
- Applicant Address: GB Wotton-Under-Edge
- Assignee: RENISHAW PLC
- Current Assignee: RENISHAW PLC
- Current Assignee Address: GB Wotton-Under-Edge
- Agency: Oliff PLC
- Priority: GB1311600.9 20130628
- International Application: PCT/GB2014/051951 WO 20140626
- International Announcement: WO2014/207470 WO 20141231
- Main IPC: G01B21/00
- IPC: G01B21/00 ; G01B21/04 ; B25J9/16 ; G01D18/00 ; G01Q40/00 ; B82Y35/00

Abstract:
A method of calibrating a contact probe having a contact element includes measuring with the contact probe a first geometric property of a calibrated artifact and a second geometric property of the or a further calibrated artifact. The first and second geometric properties are such that a deviation between a measured value and the expected value, resulting from a difference between an effective diameter of the contact element and an assumed diameter used for determining the measured value, has the opposite sign for each of the first and second geometric properties. The method further includes identifying a difference in the effective diameter of the contact element from the assumed diameter including comparing deviations of the measured value to the expected value for each of the first and second geometric properties to determine whether there is a difference in the deviations.
Public/Granted literature
- US20160138911A1 CALIBRATION OF A CONTACT PROBE Public/Granted day:2016-05-19
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