Invention Grant
- Patent Title: Distinguishing foreign surface features from native surface features
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Application No.: US15166091Application Date: 2016-05-26
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Publication No.: US09863892B2Publication Date: 2018-01-09
- Inventor: Joachim Walter Ahner , David M. Tung , Samuel Kah Hean Wong , Henry Luis Lott , Stephen Keith McLaurin , Maissarath Nassirou , Florin Zavaliche
- Applicant: Seagate Technology LLC
- Applicant Address: US CA Cupertino
- Assignee: Seagate Technology LLC
- Current Assignee: Seagate Technology LLC
- Current Assignee Address: US CA Cupertino
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N21/94 ; G01N21/95 ; G01N21/956

Abstract:
Provided herein is an apparatus, including a photon emitter configured for sequentially emitting a first set of photons and a second set of photons onto a surface of an article. In addition, a photon detector array is configured to focus the first set of photons scattered from surface features of the article in a first focal plane. The photon detector array is further configured to focus the second set of photons scattered from surface features of the article in a second focal plane, wherein the first set of photons scattered is different from the second set of photons scattered. The photon detector array is further configured to provide information for distinguishing foreign surface features of the article from native surface features of the article.
Public/Granted literature
- US20160274037A1 DISTINGUISHING FOREIGN SURFACE FEATURES FROM NATIVE SURFACE FEATURES Public/Granted day:2016-09-22
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